ロンリ ト テスト
論理とテスト / 樹下行三[ほか]著
(岩波講座マイクロエレクトロニクス / 元岡達[ほか]編 ; 4 ; VLSIの設計 ; 2)
Material Type | Books |
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Publisher | 東京 : 岩波書店 |
Year | 1985.5 |
Language | Japanese |
Size | x, 313p ; 22cm |
Hide book details.
Location | Volume | Call No. | Barcode No. | Status | Comments | ISBN | Printed | Restriction | Req Memo | Reserve |
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2F reading room |
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548.208/I/4 | 1118704933 |
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4000101846 |
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B2F stack room |
|
548.208/I/4 | 1118501220 |
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4000101846 |
|
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