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Strain-engineered MOSFETs / C.K. Maiti, T.K. Maiti
| データ種別 | 電子ブック |
|---|---|
| 出版者 | Boca Raton, FL : Taylor & Francis |
| 出版年 | ©2013 |
| 本文言語 | 英語 |
| 大きさ | 1 online resource |
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| 資料種別 | 機械可読データファイル |
|---|---|
| 内容注記 | 1. Introduction 2. Substrate-induced strain engineering in CMOS technology 3. Process-induced stress engineering in CMOS technology 4. Electronic properties of strain-engineered semiconductors 5. Strain-engineered MOSFETs 6. Noise in strain-engineered devices / C. Mukherjee 7. Technology CAD of strain-engineered MOSFETs 8. Reliability and degradation of strain-engineered MOSFETs 9. Process compact modelling of strain-engineered MOSFETs 10. Process-aware design of strain-engineered MOSFETs 11. Conclusions |
| 一般注記 | "This book brings together new developments in the area of spin-engineered MOSFETs using high-mobility substrates such as SIGe, strained-Si, germanium-on-insulator, and III-V semiconductors. The authors cover the materials aspects, principles, design, fabrication, and applications of advanced devices. They present a full TCAD methodology for strain-engineering in Si CMOS technology involving data flow from process simulation to systematic process variability simulation and generation of SPICE process compact models for manufacturing for yield optimization"-- Provided by publisher Open Access Includes bibliographical references and index Print version record |
| 著者標目 | *Maiti, C. K. Maiti, T. K. |
| 件 名 | LCSH:Electronic books BSH:Electronic books LCSH:Metal oxide semiconductor field-effect transistors -- Reliability 全ての件名で検索 LCSH:Integrated circuits -- Fault tolerance 全ての件名で検索 LCSH:Strains and stresses BISACSH:TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- General 全ての件名で検索 BISACSH:TECHNOLOGY & ENGINEERING -- Electronics -- Microelectronics 全ての件名で検索 BISACSH:TECHNOLOGY & ENGINEERING -- Material Science 全ての件名で検索 BISACSH:TECHNOLOGY & ENGINEERING -- Electronics -- Transistors 全ての件名で検索 FREE:Integrated circuits -- Fault tolerance 全ての件名で検索 FREE:Strains and stresses |
| 分 類 | DC23:621.3815/284 |
| 書誌ID | ED00001263 |
| ISBN | 9781466503472 |