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Strain-engineered MOSFETs / C.K. Maiti, T.K. Maiti
| Material Type | E-Book |
|---|---|
| Publisher | Boca Raton, FL : Taylor & Francis |
| Year | ©2013 |
| Language | English |
| Size | 1 online resource |
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| Media type | 機械可読データファイル |
|---|---|
| Contents | 1. Introduction 2. Substrate-induced strain engineering in CMOS technology 3. Process-induced stress engineering in CMOS technology 4. Electronic properties of strain-engineered semiconductors 5. Strain-engineered MOSFETs 6. Noise in strain-engineered devices / C. Mukherjee 7. Technology CAD of strain-engineered MOSFETs 8. Reliability and degradation of strain-engineered MOSFETs 9. Process compact modelling of strain-engineered MOSFETs 10. Process-aware design of strain-engineered MOSFETs 11. Conclusions |
| Notes | "This book brings together new developments in the area of spin-engineered MOSFETs using high-mobility substrates such as SIGe, strained-Si, germanium-on-insulator, and III-V semiconductors. The authors cover the materials aspects, principles, design, fabrication, and applications of advanced devices. They present a full TCAD methodology for strain-engineering in Si CMOS technology involving data flow from process simulation to systematic process variability simulation and generation of SPICE process compact models for manufacturing for yield optimization"-- Provided by publisher Open Access Includes bibliographical references and index Print version record |
| Authors | *Maiti, C. K. Maiti, T. K. |
| Subjects | LCSH:Electronic books BSH:Electronic books LCSH:Metal oxide semiconductor field-effect transistors -- Reliability All Subject Search LCSH:Integrated circuits -- Fault tolerance All Subject Search LCSH:Strains and stresses BISACSH:TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- General All Subject Search BISACSH:TECHNOLOGY & ENGINEERING -- Electronics -- Microelectronics All Subject Search BISACSH:TECHNOLOGY & ENGINEERING -- Material Science All Subject Search BISACSH:TECHNOLOGY & ENGINEERING -- Electronics -- Transistors All Subject Search FREE:Integrated circuits -- Fault tolerance All Subject Search FREE:Strains and stresses |
| Classification | DC23:621.3815/284 |
| ID | ED00001263 |
| ISBN | 9781466503472 |