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RT Book, Whole SR Electronic DC OPAC T1 Extimate technology : self-formation in a technological world / Ciano Aydin T2 Routledge studies in contemporary philosophy A1 Aydin, Ciano, 1972- YR 2021 FD 2021 SP 1 online resource K1 Electronic books K1 Technology -- Philosophy K1 Technology -- Psychological aspects K1 Experiential research K1 Self K1 Experiential research K1 Self K1 Technology -- Philosophy K1 Technology -- Psychological aspects PB Taylor & Francis PP New York SN 9781003139409 SN 100313940X SN 9781000357967 SN 1000357961 LA English (英語) CL DC23:303.48/301 NO "This book investigates how we should form ourselves in a world saturated with technologies that are profoundly intruding in the very fabric of our selfhood. How do we recognize that smart technological environments, imaging technologies and smart drugs increasingly shape who and what we are and influence who we ought to be? Tackling this issue requires going beyond the persistent and stubborn inside-outside dualism and recognizing that what we consider our "inside" self is to a great extent shaped by our "outside" world. Inspired by various philosophers - especially Nietzsche, Peirce and Lacan -this book demonstrates that the values, goals and ideals that humans encounter in their environments not only shape their identities but also enable them to critically relate to their present state. The author argues against understanding technological self-formation in terms of making ourselves better, stronger, and smarter. Rather, we should conceive it in terms of technological sublimation, which redefines the very notion of human enhancement. In this respect the author introduces an alternative, more suitable theory, namely Technological Sublimation Theory (TST). Extimate Technology will be of interest to scholars and advanced students working in philosophy of technology, philosophy of the self, phenomenology, pragmatism, and history of philosophy"-- Provided by publisher NO Open Access NO Includes bibliographical references and index NO Print version record and CIP data provided by publisher; resource not viewed NO 書誌ID=ED00004020; LK [E Book]https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=2730549 OL 30